Craig T. Pynn

1997
2	EE	Craig T. Pynn: Analyzing Manufacturing Test Costs. IEEE Design & Test of Computers 14(3): 36-40 (1997)
1995
1		Douglas W. Raymond, D. Eugene Wedge, Philip J. Stringer, Harold W. Ng, Suzanne T. Jennings, Craig T. Pynn, Winsor Soule Jr.: Algorithmic Extraction of BSDL from 1149.1-compliant Sample ICs. ITC 1995: 561-568

Coauthor Index

1	Suzanne T. Jennings	[1]
2	Harold W. Ng	[1]
3	Douglas W. Raymond	[1]
4	Winsor Soule Jr.	[1]
5	Philip J. Stringer	[1]
6	D. Eugene Wedge	[1]