| 2000 |
|---|
| 6 | EE | James C. Tsang,
Jeffrey A. Kash,
David P. Vallett:
Picosecond imaging circuit analysis.
IBM Journal of Research and Development 44(4): 583-604 (2000) |
| 1999 |
|---|
| 5 | | Phil Nigh,
David P. Vallett,
Atul Patel,
Jason Wright,
Franco Motika,
Donato Forlenza,
Ray Kurtulik,
Wendy Chong:
Failure analysis of timing and IDDq-only failures from the SEMATECH test methods experiment.
ITC 1999: 1152-1161 |
| 1998 |
|---|
| 4 | EE | Phil Nigh,
David P. Vallett,
Atul Patel,
Jason Wright:
Failure analysis of timing and IDDq-only failures from the SEMATECH test methods experiment.
ITC 1998: 43- |
| 3 | EE | Daniel R. Knebel,
Pia Sanda,
Moyra K. McManus,
Jeffrey A. Kash,
James C. Tsang,
David P. Vallett,
Leendert M. Huisman,
Phil Nigh,
Rick Rizzolo,
Peilin Song,
Franco Motika:
Diagnosis and characterization of timing-related defects by time-dependent light emission.
ITC 1998: 733-739 |
| 1997 |
|---|
| 2 | EE | David P. Vallett:
IC Failure Analysis: The Importance of Test and Diagnostics.
IEEE Design & Test of Computers 14(3): 76-82 (1997) |
| 1996 |
|---|
| 1 | | David P. Vallett:
An Overview of CMOS VLSI Failure Analysis and the Importance of Test and Diagnostics.
ITC 1996: 930 |
