2008 | ||
---|---|---|
51 | EE | Eduardo Cunha de Almeida, Gerson Sunyé, Yves Le Traon, Patrick Valduriez: Testing Peers' Volatility. ASE 2008: 419-422 |
50 | EE | Jacques Simonin, Francis Alizon, Jean-Pierre Deschrevel, Yves Le Traon, Jean-Marc Jézéquel, Bertrand Nicolas: EA4UP: An Enterprise Architecture-Assisted Telecom Service Development Method. EDOC 2008: 279-285 |
49 | EE | Yves Le Traon, Tejeddine Mouelhi, Alexander Pretschner, Benoit Baudry: Test-Driven Assessment of Access Control in Legacy Applications. ICST 2008: 238-247 |
48 | EE | Alexander Pretschner, Tejeddine Mouelhi, Yves Le Traon: Model-Based Tests for Access Control Policies. ICST 2008: 338-347 |
47 | EE | Eduardo Cunha de Almeida, Gerson Sunyé, Yves Le Traon, Patrick Valduriez: A Framework for Testing Peer-to-Peer Systems. ISSRE 2008: 167-176 |
46 | EE | Tejeddine Mouelhi, Franck Fleurey, Benoit Baudry, Yves Le Traon: A Model-Based Framework for Security Policy Specification, Deployment and Testing. MoDELS 2008: 537-552 |
2007 | ||
45 | EE | Erwan Brottier, Benoit Baudry, Yves Le Traon, David Touzet, Bertrand Nicolas: Producing a Global Requirement Model from Multiple Requirement Specifications. EDOC 2007: 390-404 |
44 | EE | Benoit Baudry, Clémentine Nebut, Yves Le Traon: Model-Driven Engineering for Requirements Analysis. EDOC 2007: 459-466 |
43 | EE | Jacques Simonin, Yves Le Traon, Jean-Marc Jézéquel: An Enterprise Architecture Alignment Measure for Telecom Service Development. EDOC 2007: 476-483 |
42 | EE | Simon Pickin, Claude Jard, Thierry Jéron, Jean-Marc Jézéquel, Yves Le Traon: Test Synthesis from UML Models of Distributed Software. IEEE Trans. Software Eng. 33(4): 252-269 (2007) |
2006 | ||
41 | Yves Le Traon: Le test et le diagnostic en vue de la m maintenance : des objets aux modéles. CAL 2006: 190 | |
40 | EE | Jean-Marie Mottu, Benoit Baudry, Yves Le Traon: Mutation Analysis Testing for Model Transformations. ECMDA-FA 2006: 376-390 |
39 | EE | Benoit Baudry, Franck Fleurey, Yves Le Traon: Improving test suites for efficient fault localization. ICSE 2006: 82-91 |
38 | EE | Erwan Brottier, Franck Fleurey, Jim Steel, Benoit Baudry, Yves Le Traon: Metamodel-based Test Generation for Model Transformations: an Algorithm and a Tool. ISSRE 2006: 85-94 |
37 | Yves Le Traon: Test et diagnostic - des objets aux modèles. LMO 2006: 17 | |
36 | Yves Le Traon, Benoit Baudry: Test d'intégration d'un système à objets - planification de l'ordre d'intégration. LMO 2006: 217-230 | |
35 | EE | Jean-Marie Mottu, Benoit Baudry, Yves Le Traon: Reusable MDA Components: A Testing-for-Trust Approach. MoDELS 2006: 589-603 |
34 | EE | Clémentine Nebut, Yves Le Traon, Jean-Marc Jézéquel: System Testing of Product Lines: From Requirements to Test Cases. Software Product Lines 2006: 447-477 |
33 | EE | Clémentine Nebut, Franck Fleurey, Yves Le Traon, Jean-Marc Jézéquel: Automatic Test Generation: A Use Case Driven Approach. IEEE Trans. Software Eng. 32(3): 140-155 (2006) |
32 | EE | Yves Le Traon, Benoit Baudry, Jean-Marc Jézéquel: Design by Contract to Improve Software Vigilance. IEEE Trans. Software Eng. 32(8): 571-586 (2006) |
2005 | ||
31 | EE | Benoit Baudry, Franck Fleurey, Jean-Marc Jézéquel, Yves Le Traon: Automatic Test Case Optimization: A Bacteriologic Algorithm. IEEE Software 22(2): 76-82 (2005) |
30 | EE | Benoit Baudry, Yves Le Traon: Measuring design testability of a UML class diagram. Information & Software Technology 47(13): 859-879 (2005) |
29 | EE | Benoit Baudry, Franck Fleurey, Jean-Marc Jézéquel, Yves Le Traon: From genetic to bacteriological algorithms for mutation-based testing. Softw. Test., Verif. Reliab. 15(2): 73-96 (2005) |
2004 | ||
28 | EE | Franck Fleurey, Yves Le Traon, Benoit Baudry: From Testing to Diagnosis: An Automated Approach. ASE 2004: 306-309 |
27 | EE | David Lugato, Frédéric Maraux, Yves Le Traon, Véronique Normand, Hubert Dubois, Jean-Yves Pierron, Jean-Pierre Gallois, Clémentine Nebut: Automated Functional Test Case Synthesis from THALES industrial Requirements. IEEE Real-Time and Embedded Technology and Applications Symposium 2004: 104-111 |
2003 | ||
26 | EE | Clémentine Nebut, Simon Pickin, Yves Le Traon, Jean-Marc Jézéquel: Automated Requirements-based Generation of Test Cases for Product Families. ASE 2003: 263-266 |
25 | EE | Benoit Baudry, Yves Le Traon, Gerson Sunyé, Jean-Marc Jézéquel: Measuring and Improving Design Patterns Testability. IEEE METRICS 2003: 50- |
24 | EE | Clémentine Nebut, Franck Fleurey, Yves Le Traon, Jean-Marc Jézéquel: Requirements by Contracts allow Automated System Testing. ISSRE 2003: 85-98 |
23 | EE | Clémentine Nebut, Franck Fleurey, Yves Le Traon, Jean-Marc Jézéquel: A Requirement-Based Approach to Test Product Families. PFE 2003: 198-210 |
22 | EE | Yves Le Traon, Farid Ouabdesselam, Chantal Robach, Benoit Baudry: From diagnosis to diagnosability: axiomatization, measurement and application. Journal of Systems and Software 65(1): 31-50 (2003) |
2002 | ||
21 | EE | Benoit Baudry, Franck Fleurey, Jean-Marc Jézéquel, Yves Le Traon: Automatic Test Cases Optimization Using a Bacteriological Adaptation Model: Application to .NET Component. ASE 2002: 253-256 |
20 | EE | Simon Pickin, Claude Jard, Yves Le Traon, Thierry Jéron, Jean-Marc Jézéquel, Alain Le Guennec: System Test Synthesis from UML Models of Distributed Software. FORTE 2002: 97-113 |
19 | EE | Benoit Baudry, Yves Le Traon, Gerson Sunyé: Testability Analysis of a UML Class Diagram. IEEE METRICS 2002: 54- |
18 | EE | Benoit Baudry, Franck Fleurey, Jean-Marc Jézéquel, Yves Le Traon: Genes and Bacteria for Automatic Test Cases Optimization in the .NET Environment. ISSRE 2002: 195-206 |
2001 | ||
17 | EE | Vu Le Hanh, Kamel Akif, Yves Le Traon, Jean-Marc Jézéquel: Selecting an Efficient OO Integration Testing Strategy: An Experimental Comparison of Actual Strategies. ECOOP 2001: 381-401 |
16 | EE | Benoit Baudry, Yves Le Traon, Jean-Marc Jézéquel: Robustness and Diagnosability of OO Systems Designed by Contracts. IEEE METRICS 2001: 272-284 |
15 | EE | Benoit Baudry, Yves Le Traon, Gerson Sunyé, Jean-Marc Jézéquel: Towards a 'Safe' Use of Design Patterns to Improve OO Software Testability. ISSRE 2001: 324-331 |
14 | EE | Gerson Sunyé, Damien Pollet, Yves Le Traon, Jean-Marc Jézéquel: Refactoring UML Models. UML 2001: 134-148 |
13 | EE | Jean-Marc Jézéquel, Daniel Deveaux, Yves Le Traon: Reliable Objects: Lightweight Testing for OO Languages. IEEE Software 18(4): 76-83 (2001) |
2000 | ||
12 | EE | Yves Le Traon, Farid Ouabdesselam, Chantal Robach: Analyzing Testability on Data Flow Designs. ISSRE 2000: 162-173 |
11 | EE | Benoit Baudry, Vu Le Hanh, Jean-Marc Jézéquel, Yves Le Traon: Building Trust into OO Components Using a Genetic Analogy. ISSRE 2000: 4-14 |
10 | EE | Benoit Baudry, Vu Le Hanh, Yves Le Traon: Testing-for-Trust: The Genetic Selection Model Applied to Component Qualification. TOOLS (33) 2000: 108-119 |
1999 | ||
9 | EE | Yves Le Traon, Daniel Deveaux, Jean-Marc Jézéquel: Self-Testable Components: From Pragmatic Tests to Design-for-Testability Methodology. TOOLS (29) 1999: 96-107 |
8 | Daniel Deveaux, Régis Fleurquin, Patrice Frison, Jean-Marc Jézéquel, Yves Le Traon: Composants objets fiables : une approche pragmatique. L'OBJET 5(3/4): (1999) | |
1998 | ||
7 | EE | Maisaa Khalil, Yves Le Traon, Chantal Robach: Towards an automatic diagnosis for high-level design validation. ITC 1998: 1010- |
1997 | ||
6 | EE | Yves Le Traon, Chantal Robach: Testability Measurements for Data Flow Designs. IEEE METRICS 1997: 91-98 |
5 | EE | Ghassan Al Hayek, Yves Le Traon, Chantal Robach: Impact of System Partitioning on Test Cost. IEEE Design & Test of Computers 14(1): 64-74 (1997) |
1996 | ||
4 | EE | Ghassan Al Hayek, Yves Le Traon, Chantal Robach: Considering Test Economics in the Process of Hardware/Software Partitioning. EUROMICRO 1996: 28- |
3 | Yves Le Traon, Ghassan Al Hayek, Chantal Robach: Testability-Oriented Hardware/Software Partitioning. ITC 1996: 725-731 | |
1995 | ||
2 | EE | Yves Le Traon, Chantal Robach: Testability analysis of co-designed systems. Asian Test Symposium 1995: 206- |
1 | Yves Le Traon, Chantal Robach: From Hardware to Software Testability. ITC 1995: 710-719 |