Philippe Perdu

2007
32	EE	Julie Ferrigno, Philippe Perdu, Kevin Sanchez, Dean Lewis: Identification of process/design issues during 0.18 µm technology qualification for space application. DATE 2007: 989-993
2006
31	EE	A. Douin, V. Pouget, M. De Matos, D. Lewis, Philippe Perdu, P. Fouillat: Time resolved imaging using synchronous picosecond Photoelectric Laser Stimulation. Microelectronics Reliability 46(9-11): 1514-1519 (2006)
30	EE	F. Essely, F. Darracq, V. Pouget, M. Remmach, Felix Beaudoin, N. Guitard, M. Bafleur, Philippe Perdu, A. Touboul, D. Lewis: Application of various optical techniques for ESD defect localization. Microelectronics Reliability 46(9-11): 1563-1568 (2006)
29	EE	C. De Nardi, Romain Desplats, Philippe Perdu, J.-L. Gauffier, C. Guérin: Descrambling and data reading techniques for flash-EEPROM memories. Application to smart cards. Microelectronics Reliability 46(9-11): 1569-1574 (2006)
2005
28	EE	A. Douin, V. Pouget, D. Lewis, P. Fouillat, Philippe Perdu: Electrical Modeling for Laser Testing with Different Pulse Durations. IOLTS 2005: 9-13
27	EE	N. Guitard, F. Essely, D. Trémouilles, M. Bafleur, N. Nolhier, Philippe Perdu, A. Touboul, V. Pouget, D. Lewis: Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure. Microelectronics Reliability 45(9-11): 1415-1420 (2005)
26	EE	Kevin Sanchez, Romain Desplats, Felix Beaudoin, Philippe Perdu, J. P. Roux, G. Woods, D. Lewis: NIR laser stimulation for dynamic timing analysis. Microelectronics Reliability 45(9-11): 1459-1464 (2005)
25	EE	Abdellatif Firiti, Felix Beaudoin, G. Haller, Philippe Perdu, D. Lewis, P. Fouillat: Impact of semiconductors material on IR Laser Stimulation signal. Microelectronics Reliability 45(9-11): 1465-1470 (2005)
24	EE	M. Remmach, A. Pigozzi, Romain Desplats, Philippe Perdu, D. Lewis, J. Noel, S. Dudit: Light Emission to Time Resolved Emission For IC Debug and Failure Analysis. Microelectronics Reliability 45(9-11): 1476-1481 (2005)
23	EE	C. De Nardi, Romain Desplats, Philippe Perdu, Felix Beaudoin, J.-L. Gauffier: Oxide charge measurements in EEPROM devices. Microelectronics Reliability 45(9-11): 1514-1519 (2005)
22	EE	Felix Beaudoin, Kevin Sanchez, Romain Desplats, Philippe Perdu, J. M. Nicot, J. P. Roux, M. Otte: Dynamic Laser Stimulation Case Studies. Microelectronics Reliability 45(9-11): 1538-1543 (2005)
21	EE	D. Briand, Felix Beaudoin, J. Courbat, N. F. de Rooij, Romain Desplats, Philippe Perdu: Failure analysis of micro-heating elements suspended on thin membranes. Microelectronics Reliability 45(9-11): 1786-1789 (2005)
2003
20	EE	Romain Desplats, Felix Beaudoin, Philippe Perdu, Nagamani Nataraj, Ted Lundquist, Ketan Shah: Fault Localization using Time Resolved Photon Emission and STIL Waveforms. ITC 2003: 254-263
19	EE	T. Beauchêne, D. Lewis, Felix Beaudoin, V. Pouget, Philippe Perdu, P. Fouillat, Y. Danto: A physical approach on SCOBIC investigation in VLSI. Microelectronics Reliability 43(1): 173-177 (2003)
18	EE	D. Trémouilles, G. Bertrand, M. Bafleur, Felix Beaudoin, Philippe Perdu, N. Guitard, L. Lescouzères: TCAD and SPICE modeling help solve ESD protection issues in analog CMOS technology. Microelectronics Reliability 43(1): 71-79 (2003)
17	EE	T. Beauchêne, D. Lewis, Felix Beaudoin, V. Pouget, Romain Desplats, P. Fouillat, Philippe Perdu, M. Bafleur, D. Trémouilles: Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization. Microelectronics Reliability 43(3): 439-444 (2003)
16	EE	Abdellatif Firiti, D. Faujour, G. Haller, J. M. Moragues, V. Goubier, Philippe Perdu, Felix Beaudoin, D. Lewis: Short defect characterization based on TCR parameter extraction. Microelectronics Reliability 43(9-11): 1563-1568 (2003)
15	EE	T. Beauchêne, D. Trémouilles, D. Lewis, Philippe Perdu, P. Fouillat: Characterization of ESD induced defects using Photovoltaic Laser Stimulation (PLS). Microelectronics Reliability 43(9-11): 1577-1582 (2003)
14	EE	M. Remmach, Romain Desplats, Felix Beaudoin, E. Frances, Philippe Perdu, D. Lewis: Time Resolved Photoemission (PICA) - From the Physics to Practical Considerations. Microelectronics Reliability 43(9-11): 1639-1644 (2003)
13	EE	Romain Desplats, A. Eral, Felix Beaudoin, Philippe Perdu, Alan J. Weger, Moyra K. McManus, Peilin Song, Franco Stellari: Faster IC Analysis with PICA Spatial Temporal Photon Correlation and CAD Autochanneling. Microelectronics Reliability 43(9-11): 1663-1668 (2003)
12	EE	Felix Beaudoin, Romain Desplats, Philippe Perdu, Abdellatif Firiti, G. Haller, V. Pouget, D. Lewis: From Static Thermal and Photoelectric Laser Stimulation (TLS/PLS) to Dynamic Laser Testing. Microelectronics Reliability 43(9-11): 1681-1686 (2003)
11	EE	Kevin Sanchez, Romain Desplats, G. Perez, V. Pichetto, Felix Beaudoin, Philippe Perdu: Solar Cell Analysis with Light Emission and OBIC Techniques. Microelectronics Reliability 43(9-11): 1755-1760 (2003)
10	EE	O. Crépel, Romain Desplats, Y. Bouttement, Philippe Perdu, C. Goupil, Ph. Descamps, Felix Beaudoin, L. Marina: Magnetic emission mapping for passive integrated components characterisation. Microelectronics Reliability 43(9-11): 1809-1814 (2003)
2002
9	EE	Felix Beaudoin, D. Carisetti, Romain Desplats, Philippe Perdu, D. Lewis, J. C. Clement: Backside Defect Localizations and Revelations Techniques on Gallium Arsenide (GaAs) Devices. Microelectronics Reliability 42(9-11): 1581-1585 (2002)
8	EE	Felix Beaudoin, G. Haller, Philippe Perdu, Romain Desplats, T. Beauchêne, D. Lewis: Reliability Defect Monitoring with Thermal Laser Stimulation: Biased Versus Unbiased. Microelectronics Reliability 42(9-11): 1729-1734 (2002)
7	EE	O. Crépel, Felix Beaudoin, L. Dantas de Morais, G. Haller, C. Goupil, Philippe Perdu, Romain Desplats, D. Lewis: Backside Hot Spot Detection Using Liquid Crystal Microscopy. Microelectronics Reliability 42(9-11): 1741-1746 (2002)
6	EE	O. Crépel, C. Goupil, B. Domengès, Ph. Descamps, Philippe Perdu, A. Doukkali: Magnetic field measurements for Non Destructive Failure Analysis. Microelectronics Reliability 42(9-11): 1763-1766 (2002)
2001
5		D. Lewis, V. Pouget, T. Beauchêne, Hervé Lapuyade, P. Fouillat, A. Touboul, Felix Beaudoin, Philippe Perdu: Front Side and Backside OBIT Mappings applied to Single Event Transient Testing. Microelectronics Reliability 41(9-10): 1471-1476 (2001)
4		Felix Beaudoin, X. Chauffleur, J. P. Fradin, Philippe Perdu, Romain Desplats, D. Lewis: Modeling Thermal Laser Stimulation. Microelectronics Reliability 41(9-10): 1477-1482 (2001)
3		Romain Desplats, Philippe Perdu, Felix Beaudoin: A New Versatile Testing Interface for Failure Analysis in Integrated Circuits. Microelectronics Reliability 41(9-10): 1495-1499 (2001)
2		Romain Desplats, Felix Beaudoin, Philippe Perdu, P. Poirier, D. Trémouilles, M. Bafleur, D. Lewis: Backside Localization of Current Leakage Faults Using Thermal Laser Stimulation. Microelectronics Reliability 41(9-10): 1539-1544 (2001)
1		Felix Beaudoin, Philippe Perdu, Romain Desplats, S. Rigo, D. Lewis: Silicon Thinning and Polishing on Packaged Devices. Microelectronics Reliability 41(9-10): 1557-1561 (2001)

Coauthor Index

1	M. Bafleur	[2] [17] [18] [27] [30]
2	T. Beauchêne	[5] [8] [15] [17] [19]
3	Felix Beaudoin	[1] [2] [3] [4] [5] [7] [8] [9] [10] [11] [12] [13] [14] [16] [17] [18] [19] [20] [21] [22] [23] [25] [26] [30]
4	G. Bertrand	[18]
5	Y. Bouttement	[10]
6	D. Briand	[21]
7	D. Carisetti	[9]
8	X. Chauffleur	[4]
9	J. C. Clement	[9]
10	J. Courbat	[21]
11	O. Crépel	[6] [7] [10]
12	Y. Danto	[19]
13	F. Darracq	[30]
14	Ph. Descamps	[6] [10]
15	Romain Desplats	[1] [2] [3] [4] [7] [8] [9] [10] [11] [12] [13] [14] [17] [20] [21] [22] [23] [24] [26] [29]
16	B. Domengès	[6]
17	A. Douin	[28] [31]
18	A. Doukkali	[6]
19	S. Dudit	[24]
20	A. Eral	[13]
21	F. Essely	[27] [30]
22	D. Faujour	[16]
23	Julie Ferrigno	[32]
24	Abdellatif Firiti	[12] [16] [25]
25	P. Fouillat	[5] [15] [17] [19] [25] [28] [31]
26	J. P. Fradin	[4]
27	E. Frances	[14]
28	J.-L. Gauffier	[23] [29]
29	V. Goubier	[16]
30	C. Goupil	[6] [7] [10]
31	C. Guérin	[29]
32	N. Guitard	[18] [27] [30]
33	G. Haller	[7] [8] [12] [16] [25]
34	Hervé Lapuyade	[5]
35	L. Lescouzères	[18]
36	D. Lewis	[1] [2] [4] [5] [7] [8] [9] [12] [14] [15] [16] [17] [19] [24] [25] [26] [27] [28] [30] [31]
37	Dean Lewis	[32]
38	Ted Lundquist	[20]
39	L. Marina	[10]
40	M. De Matos	[31]
41	Moyra K. McManus	[13]
42	J. M. Moragues	[16]
43	L. Dantas de Morais	[7]
44	C. De Nardi	[23] [29]
45	Nagamani Nataraj	[20]
46	J. M. Nicot	[22]
47	J. Noel	[24]
48	N. Nolhier	[27]
49	M. Otte	[22]
50	G. Perez	[11]
51	V. Pichetto	[11]
52	A. Pigozzi	[24]
53	P. Poirier	[2]
54	V. Pouget	[5] [12] [17] [19] [27] [28] [30] [31]
55	M. Remmach	[14] [24] [30]
56	S. Rigo	[1]
57	N. F. de Rooij	[21]
58	J. P. Roux	[22] [26]
59	Kevin Sanchez	[11] [22] [26] [32]
60	Ketan Shah	[20]
61	Peilin Song	[13]
62	Franco Stellari	[13]
63	A. Touboul	[5] [27] [30]
64	D. Trémouilles	[2] [15] [17] [18] [27]
65	Alan J. Weger	[13]
66	G. Woods	[26]