D. Lewis

2006
25	EE	A. Douin, V. Pouget, M. De Matos, D. Lewis, Philippe Perdu, P. Fouillat: Time resolved imaging using synchronous picosecond Photoelectric Laser Stimulation. Microelectronics Reliability 46(9-11): 1514-1519 (2006)
24	EE	F. Essely, F. Darracq, V. Pouget, M. Remmach, Felix Beaudoin, N. Guitard, M. Bafleur, Philippe Perdu, A. Touboul, D. Lewis: Application of various optical techniques for ESD defect localization. Microelectronics Reliability 46(9-11): 1563-1568 (2006)
2005
23	EE	A. Douin, V. Pouget, D. Lewis, P. Fouillat, Philippe Perdu: Electrical Modeling for Laser Testing with Different Pulse Durations. IOLTS 2005: 9-13
22	EE	N. Guitard, F. Essely, D. Trémouilles, M. Bafleur, N. Nolhier, Philippe Perdu, A. Touboul, V. Pouget, D. Lewis: Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure. Microelectronics Reliability 45(9-11): 1415-1420 (2005)
21	EE	Kevin Sanchez, Romain Desplats, Felix Beaudoin, Philippe Perdu, J. P. Roux, G. Woods, D. Lewis: NIR laser stimulation for dynamic timing analysis. Microelectronics Reliability 45(9-11): 1459-1464 (2005)
20	EE	Abdellatif Firiti, Felix Beaudoin, G. Haller, Philippe Perdu, D. Lewis, P. Fouillat: Impact of semiconductors material on IR Laser Stimulation signal. Microelectronics Reliability 45(9-11): 1465-1470 (2005)
19	EE	M. Remmach, A. Pigozzi, Romain Desplats, Philippe Perdu, D. Lewis, J. Noel, S. Dudit: Light Emission to Time Resolved Emission For IC Debug and Failure Analysis. Microelectronics Reliability 45(9-11): 1476-1481 (2005)
2003
18	EE	T. Beauchêne, D. Lewis, Felix Beaudoin, V. Pouget, Philippe Perdu, P. Fouillat, Y. Danto: A physical approach on SCOBIC investigation in VLSI. Microelectronics Reliability 43(1): 173-177 (2003)
17	EE	T. Beauchêne, D. Lewis, Felix Beaudoin, V. Pouget, Romain Desplats, P. Fouillat, Philippe Perdu, M. Bafleur, D. Trémouilles: Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization. Microelectronics Reliability 43(3): 439-444 (2003)
16	EE	Abdellatif Firiti, D. Faujour, G. Haller, J. M. Moragues, V. Goubier, Philippe Perdu, Felix Beaudoin, D. Lewis: Short defect characterization based on TCR parameter extraction. Microelectronics Reliability 43(9-11): 1563-1568 (2003)
15	EE	T. Beauchêne, D. Trémouilles, D. Lewis, Philippe Perdu, P. Fouillat: Characterization of ESD induced defects using Photovoltaic Laser Stimulation (PLS). Microelectronics Reliability 43(9-11): 1577-1582 (2003)
14	EE	M. Remmach, Romain Desplats, Felix Beaudoin, E. Frances, Philippe Perdu, D. Lewis: Time Resolved Photoemission (PICA) - From the Physics to Practical Considerations. Microelectronics Reliability 43(9-11): 1639-1644 (2003)
13	EE	Felix Beaudoin, Romain Desplats, Philippe Perdu, Abdellatif Firiti, G. Haller, V. Pouget, D. Lewis: From Static Thermal and Photoelectric Laser Stimulation (TLS/PLS) to Dynamic Laser Testing. Microelectronics Reliability 43(9-11): 1681-1686 (2003)
12	EE	G. Andriamonje, V. Pouget, Y. Ousten, D. Lewis, Y. Danto, J. M. Rampnoux, Y. Ezzahri, Stefan Dilhaire, Stéphane Grauby, Wilfrid Claeys: Application of Picosecond Ultrasonics to Non-Destructive Analysis in VLSI circuits. Microelectronics Reliability 43(9-11): 1803-1807 (2003)
2002
11	EE	Felix Beaudoin, D. Carisetti, Romain Desplats, Philippe Perdu, D. Lewis, J. C. Clement: Backside Defect Localizations and Revelations Techniques on Gallium Arsenide (GaAs) Devices. Microelectronics Reliability 42(9-11): 1581-1585 (2002)
10	EE	Felix Beaudoin, G. Haller, Philippe Perdu, Romain Desplats, T. Beauchêne, D. Lewis: Reliability Defect Monitoring with Thermal Laser Stimulation: Biased Versus Unbiased. Microelectronics Reliability 42(9-11): 1729-1734 (2002)
9	EE	O. Crépel, Felix Beaudoin, L. Dantas de Morais, G. Haller, C. Goupil, Philippe Perdu, Romain Desplats, D. Lewis: Backside Hot Spot Detection Using Liquid Crystal Microscopy. Microelectronics Reliability 42(9-11): 1741-1746 (2002)
2001
8	EE	D. Lewis, Hervé Lapuyade, Yann Deval, Y. Maidon, F. Darracq, R. Briand, P. Fouillat: A New Laser System for X-Rays Flashes Sensitivity Evaluation. IOLTW 2001: 111-
7		D. Lewis, V. Pouget, T. Beauchêne, Hervé Lapuyade, P. Fouillat, A. Touboul, Felix Beaudoin, Philippe Perdu: Front Side and Backside OBIT Mappings applied to Single Event Transient Testing. Microelectronics Reliability 41(9-10): 1471-1476 (2001)
6		Felix Beaudoin, X. Chauffleur, J. P. Fradin, Philippe Perdu, Romain Desplats, D. Lewis: Modeling Thermal Laser Stimulation. Microelectronics Reliability 41(9-10): 1477-1482 (2001)
5		V. Pouget, Hervé Lapuyade, P. Fouillat, D. Lewis, S. Buchner: Theoretical Investigation of an Equivalent Laser LET. Microelectronics Reliability 41(9-10): 1513-1518 (2001)
4		Romain Desplats, Felix Beaudoin, Philippe Perdu, P. Poirier, D. Trémouilles, M. Bafleur, D. Lewis: Backside Localization of Current Leakage Faults Using Thermal Laser Stimulation. Microelectronics Reliability 41(9-10): 1539-1544 (2001)
3		Felix Beaudoin, Philippe Perdu, Romain Desplats, S. Rigo, D. Lewis: Silicon Thinning and Polishing on Packaged Devices. Microelectronics Reliability 41(9-10): 1557-1561 (2001)
2000
2	EE	V. Pouget, P. Fouillat, D. Lewis, Hervé Lapuyade, L. Sarger, F. M. Roche, S. Duzellier, R. Ecoffet: An Overview of the Applications of a Pulsed Laser System for SEU Testing. IOLTW 2000: 52-
1997
1		David J. Bruemmer, R. Dickson, J. Dilatush, D. Lewis, H. Mateyak, M. Mirarchi, M. Morton, J. Tracy, A. Vorobiev, Lisa Meeden: A Situated Vacuuming Robot. AAAI/IAAI 1997: 783-784

Coauthor Index

1	G. Andriamonje	[12]
2	M. Bafleur	[4] [17] [22] [24]
3	T. Beauchêne	[7] [10] [15] [17] [18]
4	Felix Beaudoin	[3] [4] [6] [7] [9] [10] [11] [13] [14] [16] [17] [18] [20] [21] [24]
5	R. Briand	[8]
6	David J. Bruemmer	[1]
7	S. Buchner	[5]
8	D. Carisetti	[11]
9	X. Chauffleur	[6]
10	Wilfrid Claeys	[12]
11	J. C. Clement	[11]
12	O. Crépel	[9]
13	Y. Danto	[12] [18]
14	F. Darracq	[8] [24]
15	Romain Desplats	[3] [4] [6] [9] [10] [11] [13] [14] [17] [19] [21]
16	Yann Deval	[8]
17	R. Dickson	[1]
18	J. Dilatush	[1]
19	Stefan Dilhaire	[12]
20	A. Douin	[23] [25]
21	S. Dudit	[19]
22	S. Duzellier	[2]
23	R. Ecoffet	[2]
24	F. Essely	[22] [24]
25	Y. Ezzahri	[12]
26	D. Faujour	[16]
27	Abdellatif Firiti	[13] [16] [20]
28	P. Fouillat	[2] [5] [7] [8] [15] [17] [18] [20] [23] [25]
29	J. P. Fradin	[6]
30	E. Frances	[14]
31	V. Goubier	[16]
32	C. Goupil	[9]
33	Stéphane Grauby	[12]
34	N. Guitard	[22] [24]
35	G. Haller	[9] [10] [13] [16] [20]
36	Hervé Lapuyade	[2] [5] [7] [8]
37	Y. Maidon	[8]
38	H. Mateyak	[1]
39	M. De Matos	[25]
40	Lisa Meeden	[1]
41	M. Mirarchi	[1]
42	J. M. Moragues	[16]
43	L. Dantas de Morais	[9]
44	M. Morton	[1]
45	J. Noel	[19]
46	N. Nolhier	[22]
47	Y. Ousten	[12]
48	Philippe Perdu	[3] [4] [6] [7] [9] [10] [11] [13] [14] [15] [16] [17] [18] [19] [20] [21] [22] [23] [24] [25]
49	A. Pigozzi	[19]
50	P. Poirier	[4]
51	V. Pouget	[2] [5] [7] [12] [13] [17] [18] [22] [23] [24] [25]
52	J. M. Rampnoux	[12]
53	M. Remmach	[14] [19] [24]
54	S. Rigo	[3]
55	F. M. Roche	[2]
56	J. P. Roux	[21]
57	Kevin Sanchez	[21]
58	L. Sarger	[2]
59	A. Touboul	[7] [22] [24]
60	J. Tracy	[1]
61	D. Trémouilles	[4] [15] [17] [22]
62	A. Vorobiev	[1]
63	G. Woods	[21]

Colors in the list of coauthors