| 2007 |
|---|
| 9 | EE | M. Cimino,
Hervé Lapuyade,
M. De Matos,
Thierry Taris,
Yann Deval,
Jean-Baptiste Begueret:
A Robust 130 nm-CMOS Built-In Current Sensor Dedicated to RF Applications.
J. Electronic Testing 23(6): 593-603 (2007) |
| 2006 |
|---|
| 8 | EE | M. Cimino,
Hervé Lapuyade,
M. De Matos,
Thierry Taris,
Yann Deval,
Jean-Baptiste Begueret:
A Robust 130nm-CMOS Built-In Current Sensor Dedicated to RF Applications.
European Test Symposium 2006: 151-158 |
| 7 | EE | Thierry Taris,
Jean-Baptiste Begueret,
Hervé Lapuyade,
Yann Deval:
RF CMOS body-effect circuits.
Microelectronics Journal 37(11): 1251-1260 (2006) |
| 2005 |
|---|
| 6 | EE | Olivier Mazouffre,
Hervé Lapuyade,
Jean-Baptiste Begueret,
Andreia Cathelin,
Didier Belot,
Yann Deval:
A 1 V 270 My-W 2 GHz CMOS Synchronized Ring Oscillator Based Prescaler.
J. Low Power Electronics 1(2): 153-160 (2005) |
| 2003 |
|---|
| 5 | EE | F. Darracq,
Hervé Lapuyade,
N. Buard,
P. Fouillat,
R. Dufayel,
T. Carriere:
Low-cost backside laser test method to pre-characterize the COTS IC's sensitivity to Single Event Effects.
Microelectronics Reliability 43(9-11): 1615-1619 (2003) |
| 2001 |
|---|
| 4 | EE | D. Lewis,
Hervé Lapuyade,
Yann Deval,
Y. Maidon,
F. Darracq,
R. Briand,
P. Fouillat:
A New Laser System for X-Rays Flashes Sensitivity Evaluation.
IOLTW 2001: 111- |
| 3 | | D. Lewis,
V. Pouget,
T. Beauchêne,
Hervé Lapuyade,
P. Fouillat,
A. Touboul,
Felix Beaudoin,
Philippe Perdu:
Front Side and Backside OBIT Mappings applied to Single Event Transient Testing.
Microelectronics Reliability 41(9-10): 1471-1476 (2001) |
| 2 | | V. Pouget,
Hervé Lapuyade,
P. Fouillat,
D. Lewis,
S. Buchner:
Theoretical Investigation of an Equivalent Laser LET.
Microelectronics Reliability 41(9-10): 1513-1518 (2001) |
| 2000 |
|---|
| 1 | EE | V. Pouget,
P. Fouillat,
D. Lewis,
Hervé Lapuyade,
L. Sarger,
F. M. Roche,
S. Duzellier,
R. Ecoffet:
An Overview of the Applications of a Pulsed Laser System for SEU Testing.
IOLTW 2000: 52- |
