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Ph. Descamps

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2005
4EED. Abessolo-Bidzo, P. Poirier, Ph. Descamps, B. Domengès: Isolating failing sites in IC packages using time domain reflectometry: Case studies. Microelectronics Reliability 45(9-11): 1639-1644 (2005)
2003
3EEO. Crépel, Romain Desplats, Y. Bouttement, Philippe Perdu, C. Goupil, Ph. Descamps, Felix Beaudoin, L. Marina: Magnetic emission mapping for passive integrated components characterisation. Microelectronics Reliability 43(9-11): 1809-1814 (2003)
2002
2EEB. Domengès, P. Schwindenhammer, P. Poirier, Felix Beaudoin, Ph. Descamps: Comprehensive failure analysis of leakage faults in bipolar transistors. Microelectronics Reliability 42(9-11): 1449-1452 (2002)
1EEO. Crépel, C. Goupil, B. Domengès, Ph. Descamps, Philippe Perdu, A. Doukkali: Magnetic field measurements for Non Destructive Failure Analysis. Microelectronics Reliability 42(9-11): 1763-1766 (2002)

Coauthor Index

1D. Abessolo-Bidzo [4]
2Felix Beaudoin [2] [3]
3Y. Bouttement [3]
4O. Crépel [1] [3]
5Romain Desplats [3]
6B. Domengès [1] [2] [4]
7A. Doukkali [1]
8C. Goupil [1] [3]
9L. Marina [3]
10Philippe Perdu [1] [3]
11P. Poirier [2] [4]
12P. Schwindenhammer [2]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)