| |
| 2005 | ||
|---|---|---|
| 1 | EE | M. Remmach, A. Pigozzi, Romain Desplats, Philippe Perdu, D. Lewis, J. Noel, S. Dudit: Light Emission to Time Resolved Emission For IC Debug and Failure Analysis. Microelectronics Reliability 45(9-11): 1476-1481 (2005) |
| 1 | Romain Desplats | [1] |
| 2 | S. Dudit | [1] |
| 3 | D. Lewis | [1] |
| 4 | J. Noel | [1] |
| 5 | Philippe Perdu | [1] |
| 6 | M. Remmach | [1] |