2006 | ||
---|---|---|
2 | EE | F. Essely, F. Darracq, V. Pouget, M. Remmach, Felix Beaudoin, N. Guitard, M. Bafleur, Philippe Perdu, A. Touboul, D. Lewis: Application of various optical techniques for ESD defect localization. Microelectronics Reliability 46(9-11): 1563-1568 (2006) |
2005 | ||
1 | EE | N. Guitard, F. Essely, D. Trémouilles, M. Bafleur, N. Nolhier, Philippe Perdu, A. Touboul, V. Pouget, D. Lewis: Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure. Microelectronics Reliability 45(9-11): 1415-1420 (2005) |
1 | M. Bafleur | [1] [2] |
2 | Felix Beaudoin | [2] |
3 | F. Darracq | [2] |
4 | N. Guitard | [1] [2] |
5 | D. Lewis | [1] [2] |
6 | N. Nolhier | [1] |
7 | Philippe Perdu | [1] [2] |
8 | V. Pouget | [1] [2] |
9 | M. Remmach | [2] |
10 | A. Touboul | [1] [2] |
11 | D. Trémouilles | [1] |