F. Essely

2006
2	EE	F. Essely, F. Darracq, V. Pouget, M. Remmach, Felix Beaudoin, N. Guitard, M. Bafleur, Philippe Perdu, A. Touboul, D. Lewis: Application of various optical techniques for ESD defect localization. Microelectronics Reliability 46(9-11): 1563-1568 (2006)
2005
1	EE	N. Guitard, F. Essely, D. Trémouilles, M. Bafleur, N. Nolhier, Philippe Perdu, A. Touboul, V. Pouget, D. Lewis: Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure. Microelectronics Reliability 45(9-11): 1415-1420 (2005)

Coauthor Index

1	M. Bafleur	[1] [2]
2	Felix Beaudoin	[2]
3	F. Darracq	[2]
4	N. Guitard	[1] [2]
5	D. Lewis	[1] [2]
6	N. Nolhier	[1]
7	Philippe Perdu	[1] [2]
8	V. Pouget	[1] [2]
9	M. Remmach	[2]
10	A. Touboul	[1] [2]
11	D. Trémouilles	[1]