| 2005 |
|---|
| 3 | EE | D. Abessolo-Bidzo,
P. Poirier,
Ph. Descamps,
B. Domengès:
Isolating failing sites in IC packages using time domain reflectometry: Case studies.
Microelectronics Reliability 45(9-11): 1639-1644 (2005) |
| 2002 |
|---|
| 2 | EE | B. Domengès,
P. Schwindenhammer,
P. Poirier,
Felix Beaudoin,
Ph. Descamps:
Comprehensive failure analysis of leakage faults in bipolar transistors.
Microelectronics Reliability 42(9-11): 1449-1452 (2002) |
| 2001 |
|---|
| 1 | | Romain Desplats,
Felix Beaudoin,
Philippe Perdu,
P. Poirier,
D. Trémouilles,
M. Bafleur,
D. Lewis:
Backside Localization of Current Leakage Faults Using Thermal Laser Stimulation.
Microelectronics Reliability 41(9-10): 1539-1544 (2001) |
