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P. Poirier

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2005
3EED. Abessolo-Bidzo, P. Poirier, Ph. Descamps, B. Domengès: Isolating failing sites in IC packages using time domain reflectometry: Case studies. Microelectronics Reliability 45(9-11): 1639-1644 (2005)
2002
2EEB. Domengès, P. Schwindenhammer, P. Poirier, Felix Beaudoin, Ph. Descamps: Comprehensive failure analysis of leakage faults in bipolar transistors. Microelectronics Reliability 42(9-11): 1449-1452 (2002)
2001
1 Romain Desplats, Felix Beaudoin, Philippe Perdu, P. Poirier, D. Trémouilles, M. Bafleur, D. Lewis: Backside Localization of Current Leakage Faults Using Thermal Laser Stimulation. Microelectronics Reliability 41(9-10): 1539-1544 (2001)

Coauthor Index

1D. Abessolo-Bidzo [3]
2M. Bafleur [1]
3Felix Beaudoin [1] [2]
4Ph. Descamps [2] [3]
5Romain Desplats [1]
6B. Domengès [2] [3]
7D. Lewis [1]
8Philippe Perdu [1]
9P. Schwindenhammer [2]
10D. Trémouilles [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)