| 2006 |
|---|
| 11 | EE | A. Douin,
V. Pouget,
M. De Matos,
D. Lewis,
Philippe Perdu,
P. Fouillat:
Time resolved imaging using synchronous picosecond Photoelectric Laser Stimulation.
Microelectronics Reliability 46(9-11): 1514-1519 (2006) |
| 10 | EE | F. Essely,
F. Darracq,
V. Pouget,
M. Remmach,
Felix Beaudoin,
N. Guitard,
M. Bafleur,
Philippe Perdu,
A. Touboul,
D. Lewis:
Application of various optical techniques for ESD defect localization.
Microelectronics Reliability 46(9-11): 1563-1568 (2006) |
| 2005 |
|---|
| 9 | EE | A. Douin,
V. Pouget,
D. Lewis,
P. Fouillat,
Philippe Perdu:
Electrical Modeling for Laser Testing with Different Pulse Durations.
IOLTS 2005: 9-13 |
| 8 | EE | N. Guitard,
F. Essely,
D. Trémouilles,
M. Bafleur,
N. Nolhier,
Philippe Perdu,
A. Touboul,
V. Pouget,
D. Lewis:
Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure.
Microelectronics Reliability 45(9-11): 1415-1420 (2005) |
| 2003 |
|---|
| 7 | EE | T. Beauchêne,
D. Lewis,
Felix Beaudoin,
V. Pouget,
Philippe Perdu,
P. Fouillat,
Y. Danto:
A physical approach on SCOBIC investigation in VLSI.
Microelectronics Reliability 43(1): 173-177 (2003) |
| 6 | EE | T. Beauchêne,
D. Lewis,
Felix Beaudoin,
V. Pouget,
Romain Desplats,
P. Fouillat,
Philippe Perdu,
M. Bafleur,
D. Trémouilles:
Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization.
Microelectronics Reliability 43(3): 439-444 (2003) |
| 5 | EE | Felix Beaudoin,
Romain Desplats,
Philippe Perdu,
Abdellatif Firiti,
G. Haller,
V. Pouget,
D. Lewis:
From Static Thermal and Photoelectric Laser Stimulation (TLS/PLS) to Dynamic Laser Testing.
Microelectronics Reliability 43(9-11): 1681-1686 (2003) |
| 4 | EE | G. Andriamonje,
V. Pouget,
Y. Ousten,
D. Lewis,
Y. Danto,
J. M. Rampnoux,
Y. Ezzahri,
Stefan Dilhaire,
Stéphane Grauby,
Wilfrid Claeys:
Application of Picosecond Ultrasonics to Non-Destructive Analysis in VLSI circuits.
Microelectronics Reliability 43(9-11): 1803-1807 (2003) |
| 2001 |
|---|
| 3 | | D. Lewis,
V. Pouget,
T. Beauchêne,
Hervé Lapuyade,
P. Fouillat,
A. Touboul,
Felix Beaudoin,
Philippe Perdu:
Front Side and Backside OBIT Mappings applied to Single Event Transient Testing.
Microelectronics Reliability 41(9-10): 1471-1476 (2001) |
| 2 | | V. Pouget,
Hervé Lapuyade,
P. Fouillat,
D. Lewis,
S. Buchner:
Theoretical Investigation of an Equivalent Laser LET.
Microelectronics Reliability 41(9-10): 1513-1518 (2001) |
| 2000 |
|---|
| 1 | EE | V. Pouget,
P. Fouillat,
D. Lewis,
Hervé Lapuyade,
L. Sarger,
F. M. Roche,
S. Duzellier,
R. Ecoffet:
An Overview of the Applications of a Pulsed Laser System for SEU Testing.
IOLTW 2000: 52- |
