| 2007 |
|---|
| 3 | EE | M. Cimino,
Hervé Lapuyade,
M. De Matos,
Thierry Taris,
Yann Deval,
Jean-Baptiste Begueret:
A Robust 130 nm-CMOS Built-In Current Sensor Dedicated to RF Applications.
J. Electronic Testing 23(6): 593-603 (2007) |
| 2006 |
|---|
| 2 | EE | M. Cimino,
Hervé Lapuyade,
M. De Matos,
Thierry Taris,
Yann Deval,
Jean-Baptiste Begueret:
A Robust 130nm-CMOS Built-In Current Sensor Dedicated to RF Applications.
European Test Symposium 2006: 151-158 |
| 1 | EE | A. Douin,
V. Pouget,
M. De Matos,
D. Lewis,
Philippe Perdu,
P. Fouillat:
Time resolved imaging using synchronous picosecond Photoelectric Laser Stimulation.
Microelectronics Reliability 46(9-11): 1514-1519 (2006) |
