| 2006 |
|---|
| 3 | EE | F. Essely,
F. Darracq,
V. Pouget,
M. Remmach,
Felix Beaudoin,
N. Guitard,
M. Bafleur,
Philippe Perdu,
A. Touboul,
D. Lewis:
Application of various optical techniques for ESD defect localization.
Microelectronics Reliability 46(9-11): 1563-1568 (2006) |
| 2003 |
|---|
| 2 | EE | F. Darracq,
Hervé Lapuyade,
N. Buard,
P. Fouillat,
R. Dufayel,
T. Carriere:
Low-cost backside laser test method to pre-characterize the COTS IC's sensitivity to Single Event Effects.
Microelectronics Reliability 43(9-11): 1615-1619 (2003) |
| 2001 |
|---|
| 1 | EE | D. Lewis,
Hervé Lapuyade,
Yann Deval,
Y. Maidon,
F. Darracq,
R. Briand,
P. Fouillat:
A New Laser System for X-Rays Flashes Sensitivity Evaluation.
IOLTW 2001: 111- |
