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V. Goubier

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2003
1EEAbdellatif Firiti, D. Faujour, G. Haller, J. M. Moragues, V. Goubier, Philippe Perdu, Felix Beaudoin, D. Lewis: Short defect characterization based on TCR parameter extraction. Microelectronics Reliability 43(9-11): 1563-1568 (2003)

Coauthor Index

1Felix Beaudoin [1]
2D. Faujour [1]
3Abdellatif Firiti [1]
4G. Haller [1]
5D. Lewis [1]
6J. M. Moragues [1]
7Philippe Perdu [1]

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