| 2006 |
|---|
| 3 | EE | F. Essely,
F. Darracq,
V. Pouget,
M. Remmach,
Felix Beaudoin,
N. Guitard,
M. Bafleur,
Philippe Perdu,
A. Touboul,
D. Lewis:
Application of various optical techniques for ESD defect localization.
Microelectronics Reliability 46(9-11): 1563-1568 (2006) |
| 2005 |
|---|
| 2 | EE | M. Remmach,
A. Pigozzi,
Romain Desplats,
Philippe Perdu,
D. Lewis,
J. Noel,
S. Dudit:
Light Emission to Time Resolved Emission For IC Debug and Failure Analysis.
Microelectronics Reliability 45(9-11): 1476-1481 (2005) |
| 2003 |
|---|
| 1 | EE | M. Remmach,
Romain Desplats,
Felix Beaudoin,
E. Frances,
Philippe Perdu,
D. Lewis:
Time Resolved Photoemission (PICA) - From the Physics to Practical Considerations.
Microelectronics Reliability 43(9-11): 1639-1644 (2003) |
