| 2006 |
|---|
| 6 | EE | N. Rodriguez,
J. Adrian,
C. Grosjean,
G. Haller,
C. Girardeaux,
A. Portavoce:
Evaluation of scanning capacitance microscopy sample preparation by focused ion beam.
Microelectronics Reliability 46(9-11): 1554-1557 (2006) |
| 2005 |
|---|
| 5 | EE | Abdellatif Firiti,
Felix Beaudoin,
G. Haller,
Philippe Perdu,
D. Lewis,
P. Fouillat:
Impact of semiconductors material on IR Laser Stimulation signal.
Microelectronics Reliability 45(9-11): 1465-1470 (2005) |
| 2003 |
|---|
| 4 | EE | Abdellatif Firiti,
D. Faujour,
G. Haller,
J. M. Moragues,
V. Goubier,
Philippe Perdu,
Felix Beaudoin,
D. Lewis:
Short defect characterization based on TCR parameter extraction.
Microelectronics Reliability 43(9-11): 1563-1568 (2003) |
| 3 | EE | Felix Beaudoin,
Romain Desplats,
Philippe Perdu,
Abdellatif Firiti,
G. Haller,
V. Pouget,
D. Lewis:
From Static Thermal and Photoelectric Laser Stimulation (TLS/PLS) to Dynamic Laser Testing.
Microelectronics Reliability 43(9-11): 1681-1686 (2003) |
| 2002 |
|---|
| 2 | EE | Felix Beaudoin,
G. Haller,
Philippe Perdu,
Romain Desplats,
T. Beauchêne,
D. Lewis:
Reliability Defect Monitoring with Thermal Laser Stimulation: Biased Versus Unbiased.
Microelectronics Reliability 42(9-11): 1729-1734 (2002) |
| 1 | EE | O. Crépel,
Felix Beaudoin,
L. Dantas de Morais,
G. Haller,
C. Goupil,
Philippe Perdu,
Romain Desplats,
D. Lewis:
Backside Hot Spot Detection Using Liquid Crystal Microscopy.
Microelectronics Reliability 42(9-11): 1741-1746 (2002) |
