| 2005 |
|---|
| 3 | EE | Abdellatif Firiti,
Felix Beaudoin,
G. Haller,
Philippe Perdu,
D. Lewis,
P. Fouillat:
Impact of semiconductors material on IR Laser Stimulation signal.
Microelectronics Reliability 45(9-11): 1465-1470 (2005) |
| 2003 |
|---|
| 2 | EE | Abdellatif Firiti,
D. Faujour,
G. Haller,
J. M. Moragues,
V. Goubier,
Philippe Perdu,
Felix Beaudoin,
D. Lewis:
Short defect characterization based on TCR parameter extraction.
Microelectronics Reliability 43(9-11): 1563-1568 (2003) |
| 1 | EE | Felix Beaudoin,
Romain Desplats,
Philippe Perdu,
Abdellatif Firiti,
G. Haller,
V. Pouget,
D. Lewis:
From Static Thermal and Photoelectric Laser Stimulation (TLS/PLS) to Dynamic Laser Testing.
Microelectronics Reliability 43(9-11): 1681-1686 (2003) |
