| 2003 |
|---|
| 3 | EE | O. Crépel,
Romain Desplats,
Y. Bouttement,
Philippe Perdu,
C. Goupil,
Ph. Descamps,
Felix Beaudoin,
L. Marina:
Magnetic emission mapping for passive integrated components characterisation.
Microelectronics Reliability 43(9-11): 1809-1814 (2003) |
| 2002 |
|---|
| 2 | EE | O. Crépel,
Felix Beaudoin,
L. Dantas de Morais,
G. Haller,
C. Goupil,
Philippe Perdu,
Romain Desplats,
D. Lewis:
Backside Hot Spot Detection Using Liquid Crystal Microscopy.
Microelectronics Reliability 42(9-11): 1741-1746 (2002) |
| 1 | EE | O. Crépel,
C. Goupil,
B. Domengès,
Ph. Descamps,
Philippe Perdu,
A. Doukkali:
Magnetic field measurements for Non Destructive Failure Analysis.
Microelectronics Reliability 42(9-11): 1763-1766 (2002) |
