X. Chauffleur

2005
2	EE	B. Khong, P. Tounsi, Ph. Dupuy, X. Chauffleur, M. Legros, A. Deram, C. Levade, G. Vanderschaeve, J. M. Dorkel, J. P. Fradin: Innovative Methodology for Predictive Reliability of Intelligent Power Devices Using Extreme Electro-thermal Fatigue. Microelectronics Reliability 45(9-11): 1717-1722 (2005)
2001
1		Felix Beaudoin, X. Chauffleur, J. P. Fradin, Philippe Perdu, Romain Desplats, D. Lewis: Modeling Thermal Laser Stimulation. Microelectronics Reliability 41(9-10): 1477-1482 (2001)

Coauthor Index

1	Felix Beaudoin	[1]
2	A. Deram	[2]
3	Romain Desplats	[1]
4	J. M. Dorkel	[2]
5	Ph. Dupuy	[2]
6	J. P. Fradin	[1] [2]
7	B. Khong	[2]
8	M. Legros	[2]
9	C. Levade	[2]
10	D. Lewis	[1]
11	Philippe Perdu	[1]
12	P. Tounsi	[2]
13	G. Vanderschaeve	[2]