| 2005 |
|---|
| 5 | EE | N. Guitard,
F. Essely,
D. Trémouilles,
M. Bafleur,
N. Nolhier,
Philippe Perdu,
A. Touboul,
V. Pouget,
D. Lewis:
Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure.
Microelectronics Reliability 45(9-11): 1415-1420 (2005) |
| 2003 |
|---|
| 4 | EE | D. Trémouilles,
G. Bertrand,
M. Bafleur,
Felix Beaudoin,
Philippe Perdu,
N. Guitard,
L. Lescouzères:
TCAD and SPICE modeling help solve ESD protection issues in analog CMOS technology.
Microelectronics Reliability 43(1): 71-79 (2003) |
| 3 | EE | T. Beauchêne,
D. Lewis,
Felix Beaudoin,
V. Pouget,
Romain Desplats,
P. Fouillat,
Philippe Perdu,
M. Bafleur,
D. Trémouilles:
Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization.
Microelectronics Reliability 43(3): 439-444 (2003) |
| 2 | EE | T. Beauchêne,
D. Trémouilles,
D. Lewis,
Philippe Perdu,
P. Fouillat:
Characterization of ESD induced defects using Photovoltaic Laser Stimulation (PLS).
Microelectronics Reliability 43(9-11): 1577-1582 (2003) |
| 2001 |
|---|
| 1 | | Romain Desplats,
Felix Beaudoin,
Philippe Perdu,
P. Poirier,
D. Trémouilles,
M. Bafleur,
D. Lewis:
Backside Localization of Current Leakage Faults Using Thermal Laser Stimulation.
Microelectronics Reliability 41(9-10): 1539-1544 (2001) |
