J. M. Moragues

2005
2	EE	D. Goguenheim, A. Bravaix, S. Gomri, J. M. Moragues, C. Monserie, N. Legrand, P. Boivin: Impact of wafer charging on hot carrier reliability and optimization of latent damage detection methodology in advanced CMOS technologies. Microelectronics Reliability 45(3-4): 487-492 (2005)
2003
1	EE	Abdellatif Firiti, D. Faujour, G. Haller, J. M. Moragues, V. Goubier, Philippe Perdu, Felix Beaudoin, D. Lewis: Short defect characterization based on TCR parameter extraction. Microelectronics Reliability 43(9-11): 1563-1568 (2003)

Coauthor Index

1	Felix Beaudoin	[1]
2	P. Boivin	[2]
3	A. Bravaix	[2]
4	D. Faujour	[1]
5	Abdellatif Firiti	[1]
6	D. Goguenheim	[2]
7	S. Gomri	[2]
8	V. Goubier	[1]
9	G. Haller	[1]
10	N. Legrand	[2]
11	D. Lewis	[1]
12	C. Monserie	[2]
13	Philippe Perdu	[1]

Colors in the list of coauthors