| 2006 |
|---|
| 3 | EE | F. Essely,
F. Darracq,
V. Pouget,
M. Remmach,
Felix Beaudoin,
N. Guitard,
M. Bafleur,
Philippe Perdu,
A. Touboul,
D. Lewis:
Application of various optical techniques for ESD defect localization.
Microelectronics Reliability 46(9-11): 1563-1568 (2006) |
| 2005 |
|---|
| 2 | EE | N. Guitard,
F. Essely,
D. Trémouilles,
M. Bafleur,
N. Nolhier,
Philippe Perdu,
A. Touboul,
V. Pouget,
D. Lewis:
Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure.
Microelectronics Reliability 45(9-11): 1415-1420 (2005) |
| 2003 |
|---|
| 1 | EE | D. Trémouilles,
G. Bertrand,
M. Bafleur,
Felix Beaudoin,
Philippe Perdu,
N. Guitard,
L. Lescouzères:
TCAD and SPICE modeling help solve ESD protection issues in analog CMOS technology.
Microelectronics Reliability 43(1): 71-79 (2003) |
