| |
| 2006 | ||
|---|---|---|
| 2 | EE | C. De Nardi, Romain Desplats, Philippe Perdu, J.-L. Gauffier, C. Guérin: Descrambling and data reading techniques for flash-EEPROM memories. Application to smart cards. Microelectronics Reliability 46(9-11): 1569-1574 (2006) |
| 2005 | ||
| 1 | EE | C. De Nardi, Romain Desplats, Philippe Perdu, Felix Beaudoin, J.-L. Gauffier: Oxide charge measurements in EEPROM devices. Microelectronics Reliability 45(9-11): 1514-1519 (2005) |
| 1 | Felix Beaudoin | [1] |
| 2 | Romain Desplats | [1] [2] |
| 3 | J.-L. Gauffier | [1] [2] |
| 4 | C. Guérin | [2] |
| 5 | Philippe Perdu | [1] [2] |