| |
| 2003 | ||
|---|---|---|
| 1 | EE | Abdellatif Firiti, D. Faujour, G. Haller, J. M. Moragues, V. Goubier, Philippe Perdu, Felix Beaudoin, D. Lewis: Short defect characterization based on TCR parameter extraction. Microelectronics Reliability 43(9-11): 1563-1568 (2003) |
| 1 | Felix Beaudoin | [1] |
| 2 | Abdellatif Firiti | [1] |
| 3 | V. Goubier | [1] |
| 4 | G. Haller | [1] |
| 5 | D. Lewis | [1] |
| 6 | J. M. Moragues | [1] |
| 7 | Philippe Perdu | [1] |