| |
| 2003 | ||
|---|---|---|
| 1 | EE | O. Crépel, Romain Desplats, Y. Bouttement, Philippe Perdu, C. Goupil, Ph. Descamps, Felix Beaudoin, L. Marina: Magnetic emission mapping for passive integrated components characterisation. Microelectronics Reliability 43(9-11): 1809-1814 (2003) |
| 1 | Felix Beaudoin | [1] |
| 2 | O. Crépel | [1] |
| 3 | Ph. Descamps | [1] |
| 4 | Romain Desplats | [1] |
| 5 | C. Goupil | [1] |
| 6 | L. Marina | [1] |
| 7 | Philippe Perdu | [1] |