2005 |
3 | EE | B. Khong,
P. Tounsi,
Ph. Dupuy,
X. Chauffleur,
M. Legros,
A. Deram,
C. Levade,
G. Vanderschaeve,
J. M. Dorkel,
J. P. Fradin:
Innovative Methodology for Predictive Reliability of Intelligent Power Devices Using Extreme Electro-thermal Fatigue.
Microelectronics Reliability 45(9-11): 1717-1722 (2005) |
2001 |
2 | | Felix Beaudoin,
X. Chauffleur,
J. P. Fradin,
Philippe Perdu,
Romain Desplats,
D. Lewis:
Modeling Thermal Laser Stimulation.
Microelectronics Reliability 41(9-10): 1477-1482 (2001) |
1997 |
1 | EE | J. P. Fradin,
L. Molla,
B. Desaunettes:
Analysis of 3D conjugate heat transfers in electronics.
ED&TC 1997: 190-194 |