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| 2003 | ||
|---|---|---|
| 1 | EE | D. Trémouilles, G. Bertrand, M. Bafleur, Felix Beaudoin, Philippe Perdu, N. Guitard, L. Lescouzères: TCAD and SPICE modeling help solve ESD protection issues in analog CMOS technology. Microelectronics Reliability 43(1): 71-79 (2003) |
| 1 | M. Bafleur | [1] |
| 2 | Felix Beaudoin | [1] |
| 3 | G. Bertrand | [1] |
| 4 | N. Guitard | [1] |
| 5 | Philippe Perdu | [1] |
| 6 | D. Trémouilles | [1] |