N. Nolhier

2005
2	EE	N. Guitard, F. Essely, D. Trémouilles, M. Bafleur, N. Nolhier, Philippe Perdu, A. Touboul, V. Pouget, D. Lewis: Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure. Microelectronics Reliability 45(9-11): 1415-1420 (2005)
2003
1	EE	M. Zecri, P. Besse, P. Givelin, M. Nayrolles, M. Bafleur, N. Nolhier: Determination of the ESD Failure Cause Through its Signature. Microelectronics Reliability 43(9-11): 1551-1556 (2003)

Coauthor Index

1	M. Bafleur	[1] [2]
2	P. Besse	[1]
3	F. Essely	[2]
4	P. Givelin	[1]
5	N. Guitard	[2]
6	D. Lewis	[2]
7	M. Nayrolles	[1]
8	Philippe Perdu	[2]
9	V. Pouget	[2]
10	A. Touboul	[2]
11	D. Trémouilles	[2]
12	M. Zecri	[1]