| 2003 |
|---|
| 5 | EE | T. Beauchêne,
D. Lewis,
Felix Beaudoin,
V. Pouget,
Philippe Perdu,
P. Fouillat,
Y. Danto:
A physical approach on SCOBIC investigation in VLSI.
Microelectronics Reliability 43(1): 173-177 (2003) |
| 4 | EE | T. Beauchêne,
D. Lewis,
Felix Beaudoin,
V. Pouget,
Romain Desplats,
P. Fouillat,
Philippe Perdu,
M. Bafleur,
D. Trémouilles:
Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization.
Microelectronics Reliability 43(3): 439-444 (2003) |
| 3 | EE | T. Beauchêne,
D. Trémouilles,
D. Lewis,
Philippe Perdu,
P. Fouillat:
Characterization of ESD induced defects using Photovoltaic Laser Stimulation (PLS).
Microelectronics Reliability 43(9-11): 1577-1582 (2003) |
| 2002 |
|---|
| 2 | EE | Felix Beaudoin,
G. Haller,
Philippe Perdu,
Romain Desplats,
T. Beauchêne,
D. Lewis:
Reliability Defect Monitoring with Thermal Laser Stimulation: Biased Versus Unbiased.
Microelectronics Reliability 42(9-11): 1729-1734 (2002) |
| 2001 |
|---|
| 1 | | D. Lewis,
V. Pouget,
T. Beauchêne,
Hervé Lapuyade,
P. Fouillat,
A. Touboul,
Felix Beaudoin,
Philippe Perdu:
Front Side and Backside OBIT Mappings applied to Single Event Transient Testing.
Microelectronics Reliability 41(9-10): 1471-1476 (2001) |
