| 2007 |
|---|
| 3 | EE | C. R. Parthasarathy,
A. Bravaix,
C. Guérin,
M. Denais,
V. Huard:
Design-In Reliability for 90-65nm CMOS Nodes Submitted to Hot-Carriers and NBTI Degradation.
PATMOS 2007: 191-200 |
| 2006 |
|---|
| 2 | EE | C. R. Parthasarathy,
M. Denais,
V. Huard,
G. Ribes,
D. Roy,
C. Guérin,
F. Perrier,
E. Vincent,
A. Bravaix:
Designing in reliability in advanced CMOS technologies.
Microelectronics Reliability 46(9-11): 1464-1471 (2006) |
| 1 | EE | C. De Nardi,
Romain Desplats,
Philippe Perdu,
J.-L. Gauffier,
C. Guérin:
Descrambling and data reading techniques for flash-EEPROM memories. Application to smart cards.
Microelectronics Reliability 46(9-11): 1569-1574 (2006) |
