2008 |
9 | EE | Ruchir Puri,
Devadas Varma,
Darvin Edwards,
Alan J. Weger,
Paul Franzon,
Andrew Yang,
Stephen V. Kosonocky:
Keeping hot chips cool: are IC thermal problems hot air?
DAC 2008: 634-635 |
2007 |
8 | EE | Jeonghwan Choi,
Chen-Yong Cher,
Hubertus Franke,
Henrdrik Hamann,
Alan J. Weger,
Pradip Bose:
Thermal-aware task scheduling at the system software level.
ISLPED 2007: 213-218 |
7 | EE | Hendrik F. Hamann,
Alan J. Weger,
James A. Lacey,
Zhigang Hu,
Pradip Bose,
Erwin Cohen,
Jamil A. Wakil:
Temperature-limited microprocessors: Measurements and design implications.
VLSI Design 2007: 427-432 |
2005 |
6 | EE | Stas Polonsky,
M. Bhushan,
A. Gattiker,
Alan J. Weger,
Peilin Song:
Photon emission microscopy of inter/intra chip device performance variations.
Microelectronics Reliability 45(9-11): 1471-1475 (2005) |
2004 |
5 | EE | Stas Polonsky,
Keith A. Jenkins,
Alan J. Weger,
Shinho Cho:
CMOS IC diagnostics using the luminescence of OFF-state leakage currents.
ITC 2004: 134-139 |
4 | EE | Peilin Song,
Franco Stellari,
Alan J. Weger,
Tian Xia:
A Novel Scan Chain Diagnostics Technique Based on Light Emission from Leakage Current.
ITC 2004: 140-147 |
2003 |
3 | EE | Franco Stellari,
Peilin Song,
Moyra K. McManus,
Robert Gauthier,
Alan J. Weger,
Kiran V. Chatty,
Mujahid Muhammad,
Pia Sanda:
Optical and Electrical Testing of Latchup in I/O Interface Circuits.
ITC 2003: 236-245 |
2 | EE | Franco Stellari,
Peilin Song,
Moyra K. McManus,
Alan J. Weger,
Robert Gauthier,
Kiran V. Chatty,
Mujahid Muhammad,
Pia Sanda,
Philip Wu,
Steve Wilson:
Latchup Analysis Using Emission Microscopy.
Microelectronics Reliability 43(9-11): 1603-1608 (2003) |
1 | EE | Romain Desplats,
A. Eral,
Felix Beaudoin,
Philippe Perdu,
Alan J. Weger,
Moyra K. McManus,
Peilin Song,
Franco Stellari:
Faster IC Analysis with PICA Spatial Temporal Photon Correlation and CAD Autochanneling.
Microelectronics Reliability 43(9-11): 1663-1668 (2003) |