| |
| 2002 | ||
|---|---|---|
| 1 | EE | O. Crépel, Felix Beaudoin, L. Dantas de Morais, G. Haller, C. Goupil, Philippe Perdu, Romain Desplats, D. Lewis: Backside Hot Spot Detection Using Liquid Crystal Microscopy. Microelectronics Reliability 42(9-11): 1741-1746 (2002) |
| 1 | Felix Beaudoin | [1] |
| 2 | O. Crépel | [1] |
| 3 | Romain Desplats | [1] |
| 4 | C. Goupil | [1] |
| 5 | G. Haller | [1] |
| 6 | D. Lewis | [1] |
| 7 | Philippe Perdu | [1] |