Romain Desplats

2006
20	EE	C. De Nardi, Romain Desplats, Philippe Perdu, J.-L. Gauffier, C. Guérin: Descrambling and data reading techniques for flash-EEPROM memories. Application to smart cards. Microelectronics Reliability 46(9-11): 1569-1574 (2006)
2005
19	EE	Kevin Sanchez, Romain Desplats, Felix Beaudoin, Philippe Perdu, J. P. Roux, G. Woods, D. Lewis: NIR laser stimulation for dynamic timing analysis. Microelectronics Reliability 45(9-11): 1459-1464 (2005)
18	EE	M. Remmach, A. Pigozzi, Romain Desplats, Philippe Perdu, D. Lewis, J. Noel, S. Dudit: Light Emission to Time Resolved Emission For IC Debug and Failure Analysis. Microelectronics Reliability 45(9-11): 1476-1481 (2005)
17	EE	C. De Nardi, Romain Desplats, Philippe Perdu, Felix Beaudoin, J.-L. Gauffier: Oxide charge measurements in EEPROM devices. Microelectronics Reliability 45(9-11): 1514-1519 (2005)
16	EE	Felix Beaudoin, Kevin Sanchez, Romain Desplats, Philippe Perdu, J. M. Nicot, J. P. Roux, M. Otte: Dynamic Laser Stimulation Case Studies. Microelectronics Reliability 45(9-11): 1538-1543 (2005)
15	EE	D. Briand, Felix Beaudoin, J. Courbat, N. F. de Rooij, Romain Desplats, Philippe Perdu: Failure analysis of micro-heating elements suspended on thin membranes. Microelectronics Reliability 45(9-11): 1786-1789 (2005)
2003
14	EE	Romain Desplats, Felix Beaudoin, Philippe Perdu, Nagamani Nataraj, Ted Lundquist, Ketan Shah: Fault Localization using Time Resolved Photon Emission and STIL Waveforms. ITC 2003: 254-263
13	EE	T. Beauchêne, D. Lewis, Felix Beaudoin, V. Pouget, Romain Desplats, P. Fouillat, Philippe Perdu, M. Bafleur, D. Trémouilles: Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization. Microelectronics Reliability 43(3): 439-444 (2003)
12	EE	M. Remmach, Romain Desplats, Felix Beaudoin, E. Frances, Philippe Perdu, D. Lewis: Time Resolved Photoemission (PICA) - From the Physics to Practical Considerations. Microelectronics Reliability 43(9-11): 1639-1644 (2003)
11	EE	Romain Desplats, A. Eral, Felix Beaudoin, Philippe Perdu, Alan J. Weger, Moyra K. McManus, Peilin Song, Franco Stellari: Faster IC Analysis with PICA Spatial Temporal Photon Correlation and CAD Autochanneling. Microelectronics Reliability 43(9-11): 1663-1668 (2003)
10	EE	Felix Beaudoin, Romain Desplats, Philippe Perdu, Abdellatif Firiti, G. Haller, V. Pouget, D. Lewis: From Static Thermal and Photoelectric Laser Stimulation (TLS/PLS) to Dynamic Laser Testing. Microelectronics Reliability 43(9-11): 1681-1686 (2003)
9	EE	Kevin Sanchez, Romain Desplats, G. Perez, V. Pichetto, Felix Beaudoin, Philippe Perdu: Solar Cell Analysis with Light Emission and OBIC Techniques. Microelectronics Reliability 43(9-11): 1755-1760 (2003)
8	EE	O. Crépel, Romain Desplats, Y. Bouttement, Philippe Perdu, C. Goupil, Ph. Descamps, Felix Beaudoin, L. Marina: Magnetic emission mapping for passive integrated components characterisation. Microelectronics Reliability 43(9-11): 1809-1814 (2003)
2002
7	EE	Felix Beaudoin, D. Carisetti, Romain Desplats, Philippe Perdu, D. Lewis, J. C. Clement: Backside Defect Localizations and Revelations Techniques on Gallium Arsenide (GaAs) Devices. Microelectronics Reliability 42(9-11): 1581-1585 (2002)
6	EE	Felix Beaudoin, G. Haller, Philippe Perdu, Romain Desplats, T. Beauchêne, D. Lewis: Reliability Defect Monitoring with Thermal Laser Stimulation: Biased Versus Unbiased. Microelectronics Reliability 42(9-11): 1729-1734 (2002)
5	EE	O. Crépel, Felix Beaudoin, L. Dantas de Morais, G. Haller, C. Goupil, Philippe Perdu, Romain Desplats, D. Lewis: Backside Hot Spot Detection Using Liquid Crystal Microscopy. Microelectronics Reliability 42(9-11): 1741-1746 (2002)
2001
4		Felix Beaudoin, X. Chauffleur, J. P. Fradin, Philippe Perdu, Romain Desplats, D. Lewis: Modeling Thermal Laser Stimulation. Microelectronics Reliability 41(9-10): 1477-1482 (2001)
3		Romain Desplats, Philippe Perdu, Felix Beaudoin: A New Versatile Testing Interface for Failure Analysis in Integrated Circuits. Microelectronics Reliability 41(9-10): 1495-1499 (2001)
2		Romain Desplats, Felix Beaudoin, Philippe Perdu, P. Poirier, D. Trémouilles, M. Bafleur, D. Lewis: Backside Localization of Current Leakage Faults Using Thermal Laser Stimulation. Microelectronics Reliability 41(9-10): 1539-1544 (2001)
1		Felix Beaudoin, Philippe Perdu, Romain Desplats, S. Rigo, D. Lewis: Silicon Thinning and Polishing on Packaged Devices. Microelectronics Reliability 41(9-10): 1557-1561 (2001)

Coauthor Index

1	M. Bafleur	[2] [13]
2	T. Beauchêne	[6] [13]
3	Felix Beaudoin	[1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12] [13] [14] [15] [16] [17] [19]
4	Y. Bouttement	[8]
5	D. Briand	[15]
6	D. Carisetti	[7]
7	X. Chauffleur	[4]
8	J. C. Clement	[7]
9	J. Courbat	[15]
10	O. Crépel	[5] [8]
11	Ph. Descamps	[8]
12	S. Dudit	[18]
13	A. Eral	[11]
14	Abdellatif Firiti	[10]
15	P. Fouillat	[13]
16	J. P. Fradin	[4]
17	E. Frances	[12]
18	J.-L. Gauffier	[17] [20]
19	C. Goupil	[5] [8]
20	C. Guérin	[20]
21	G. Haller	[5] [6] [10]
22	D. Lewis	[1] [2] [4] [5] [6] [7] [10] [12] [13] [18] [19]
23	Ted Lundquist	[14]
24	L. Marina	[8]
25	Moyra K. McManus	[11]
26	L. Dantas de Morais	[5]
27	C. De Nardi	[17] [20]
28	Nagamani Nataraj	[14]
29	J. M. Nicot	[16]
30	J. Noel	[18]
31	M. Otte	[16]
32	Philippe Perdu	[1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12] [13] [14] [15] [16] [17] [18] [19] [20]
33	G. Perez	[9]
34	V. Pichetto	[9]
35	A. Pigozzi	[18]
36	P. Poirier	[2]
37	V. Pouget	[10] [13]
38	M. Remmach	[12] [18]
39	S. Rigo	[1]
40	N. F. de Rooij	[15]
41	J. P. Roux	[16] [19]
42	Kevin Sanchez	[9] [16] [19]
43	Ketan Shah	[14]
44	Peilin Song	[11]
45	Franco Stellari	[11]
46	D. Trémouilles	[2] [13]
47	Alan J. Weger	[11]
48	G. Woods	[19]