| |
| 2002 | ||
|---|---|---|
| 1 | EE | O. Crépel, C. Goupil, B. Domengès, Ph. Descamps, Philippe Perdu, A. Doukkali: Magnetic field measurements for Non Destructive Failure Analysis. Microelectronics Reliability 42(9-11): 1763-1766 (2002) |
| 1 | O. Crépel | [1] |
| 2 | Ph. Descamps | [1] |
| 3 | B. Domengès | [1] |
| 4 | C. Goupil | [1] |
| 5 | Philippe Perdu | [1] |