| |
| 2002 | ||
|---|---|---|
| 1 | EE | Felix Beaudoin, D. Carisetti, Romain Desplats, Philippe Perdu, D. Lewis, J. C. Clement: Backside Defect Localizations and Revelations Techniques on Gallium Arsenide (GaAs) Devices. Microelectronics Reliability 42(9-11): 1581-1585 (2002) |
| 1 | Felix Beaudoin | [1] |
| 2 | J. C. Clement | [1] |
| 3 | Romain Desplats | [1] |
| 4 | D. Lewis | [1] |
| 5 | Philippe Perdu | [1] |