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Christian Olgaard

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2004
3EESule Ozev, Christian Olgaard: Wafer-level RF Test and DfT for VCO Modulating Transceiver Architecures. VTS 2004: 217-222
2002
2EESule Ozev, Christian Olgaard, Alex Orailoglu: Multilevel Testability Analysis and Solutions for Integrated Bluetooth Transceivers. IEEE Design & Test of Computers 19(5): 82-91 (2002)
2001
1 Christian Olgaard, Sule Ozev, Alex Orailoglu: Testability implications in low-cost integrated radio transceivers: a Bluetooth case study. ITC 2001: 965-974

Coauthor Index

1Alex Orailoglu [1] [2]
2Sule Ozev [1] [2] [3]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)