Jonathan R. Carter

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2007

2 EE Jonathan R. Carter, Sule Ozev, Daniel J. Sorin: Circuit-Level Modeling for Concurrent Testing of Operational Defects due to Gate Oxide Breakdown CoRR abs/0710.4715: (2007)

2005

1 EE Jonathan R. Carter, Sule Ozev, Daniel J. Sorin: Circuit-Level Modeling for Concurrent Testing of Operational Defects due to Gate Oxide Breakdown. DATE 2005: 300-305

2007
2	EE	Jonathan R. Carter, Sule Ozev, Daniel J. Sorin: Circuit-Level Modeling for Concurrent Testing of Operational Defects due to Gate Oxide Breakdown CoRR abs/0710.4715: (2007)
2005
1	EE	Jonathan R. Carter, Sule Ozev, Daniel J. Sorin: Circuit-Level Modeling for Concurrent Testing of Operational Defects due to Gate Oxide Breakdown. DATE 2005: 300-305

Coauthor Index

1 Sule Ozev [1] [2]

2 Daniel J. Sorin [1] [2]