2007 |
12 | EE | Donghwi Lee,
Erik H. Volkerink,
Intaik Park,
Jeff Rearick:
Empirical Validation of Yield Recovery Using Idle-Cycle Insertion.
IEEE Design & Test of Computers 24(4): 362-372 (2007) |
2005 |
11 | EE | Erik H. Volkerink,
Subhasish Mitra:
Response compaction with any number of unknowns using a new LFSR architecture.
DAC 2005: 117-122 |
2004 |
10 | EE | Kenneth A. Brand,
Erik H. Volkerink,
Edward J. McCluskey,
Subhasish Mitra:
Speed Clustering of Integrated Circuits.
ITC 2004: 1128-1137 |
9 | EE | Edward J. McCluskey,
Ahmad A. Al-Yamani,
Chien-Mo James Li,
Chao-Wen Tseng,
Erik H. Volkerink,
François-Fabien Ferhani,
Edward Li,
Subhasish Mitra:
ELF-Murphy Data on Defects and Test Sets.
VTS 2004: 16-22 |
8 | EE | Subhasish Mitra,
Erik H. Volkerink,
Edward J. McCluskey,
Stefan Eichenberger:
Delay Defect Screening using Process Monitor Structures.
VTS 2004: 43-52 |
2003 |
7 | EE | Harald P. E. Vranken,
Friedrich Hapke,
Soenke Rogge,
Domenico Chindamo,
Erik H. Volkerink:
ATPG Padding And ATE Vector Repeat Per Port For Reducing Test Data Volume.
ITC 2003: 1069-1078 |
6 | EE | Erik H. Volkerink,
Subhasish Mitra:
Efficient Seed Utilization for Reseeding based Compression.
VTS 2003: 232-240 |
5 | EE | Erik H. Volkerink,
Ajay Khoche,
Jochen Rivoir,
Klaus D. Hilliges:
Modern Test Techniques: Tradeoffs, Synergies, and Scalable Benefits.
J. Electronic Testing 19(2): 125-135 (2003) |
2002 |
4 | EE | Erik H. Volkerink,
Ajay Khoche,
Subhasish Mitra:
Packet-Based Input Test Data Compression Techniques.
ITC 2002: 154-163 |
3 | EE | Erik H. Volkerink,
Ajay Khoche,
Jochen Rivoir,
Klaus D. Hilliges:
Test Economics for Multi-site Test with Modern Cost Reduction Techniques.
VTS 2002: 411-416 |
2 | EE | Ajay Khoche,
Erik H. Volkerink,
Jochen Rivoir,
Subhasish Mitra:
Test Vector Compression Using EDA-ATE Synergies.
VTS 2002: 97-102 |
2001 |
1 | | Erik H. Volkerink,
Ajay Khoche,
Linda A. Kamas,
Jochen Rivoir,
Hans G. Kerkhoff:
Tackling test trade-offs from design, manufacturing to market using economic modeling.
ITC 2001: 1098-1107 |