M. Shashani
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2001
1
EE
Hans G. Kerkhoff
,
Han Speek
, M. Shashani,
Manoj Sachdev
: Design for Delay Testability in High-Speed Digital ICs.
J. Electronic Testing 17
(3-4): 225-231 (2001)
Coauthor
Index
1
Hans G. Kerkhoff
[
1
]
2
Manoj Sachdev
[
1
]
3
Han Speek
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
