| |
| 2002 | ||
|---|---|---|
| 1 | EE | Frank te Beest, Ad M. G. Peeters, Marc Verra, Kees van Berkel, Hans G. Kerkhoff: Automatic Scan Insertion and Test Generation for Asynchronous Circuits. ITC 2002: 804-813 |
| 1 | Frank te Beest | [1] |
| 2 | Kees van Berkel | [1] |
| 3 | Hans G. Kerkhoff | [1] |
| 4 | Ad M. G. Peeters | [1] |