| 2005 |
|---|
| 5 | EE | Frank te Beest,
Ad M. G. Peeters:
A Multiplexor Based Test Method for Self-Timed Circuits.
ASYNC 2005: 166-175 |
| 2003 |
|---|
| 4 | EE | Frank te Beest,
Ad M. G. Peeters,
Kees van Berkel,
Hans G. Kerkhoff:
Synchronous Full-Scan for Asynchronous Handshake Circuits.
J. Electronic Testing 19(4): 397-406 (2003) |
| 3 | EE | Kees van Berkel,
Ad M. G. Peeters,
Frank te Beest:
Adding synchronous and LSSD modes to asynchronous circuits.
Microprocessors and Microsystems 27(9): 461-471 (2003) |
| 2002 |
|---|
| 2 | EE | Frank te Beest,
Kees van Berkel,
Ad M. G. Peeters:
Adding Synchronous and LSSD Modes to Asynchronous Circuits.
ASYNC 2002: 161-170 |
| 1 | EE | Frank te Beest,
Ad M. G. Peeters,
Marc Verra,
Kees van Berkel,
Hans G. Kerkhoff:
Automatic Scan Insertion and Test Generation for Asynchronous Circuits.
ITC 2002: 804-813 |
