| |
| 2001 | ||
|---|---|---|
| 2 | EE | Hans G. Kerkhoff, Han Speek, M. Shashani, Manoj Sachdev: Design for Delay Testability in High-Speed Digital ICs. J. Electronic Testing 17(3-4): 225-231 (2001) |
| 1999 | ||
| 1 | EE | Nur Engin, Hans G. Kerkhoff, Ronald J. W. T. Tangelder, Han Speek: Integrated Design and Test of Mixed-Signal Circuits. J. Electronic Testing 14(1-2): 75-83 (1999) |
| 1 | Nur Engin | [1] |
| 2 | Hans G. Kerkhoff | [1] [2] |
| 3 | Manoj Sachdev | [2] |
| 4 | M. Shashani | [2] |
| 5 | Ronald J. W. T. Tangelder | [1] |