| 2007 |
|---|
| 5 | EE | Paul Wielage,
Erik Jan Marinissen,
Michel Altheimer,
Clemens Wouters:
Design and DfT of a high-speed area-efficient embedded asynchronous FIFO.
DATE 2007: 853-858 |
| 4 | EE | Tobias Dubois,
Erik Jan Marinissen,
Mohamed Azimane,
Paul Wielage,
Erik Larsson,
Clemens Wouters:
Test quality analysis and improvement for an embedded asynchronous FIFO.
DATE 2007: 859-864 |
| 2001 |
|---|
| 3 | EE | Sandeep Koranne,
Tom Waayers,
Robert Beurze,
Clemens Wouters,
Sunil Kumar,
G. S. Visweswara:
A P1500 Compliant Programable BistShell for Embedded Memories.
MTDT 2001: 21-28 |
| 1999 |
|---|
| 2 | EE | Chris Feige,
Jan Ten Pierick,
Clemens Wouters,
Ronald J. W. T. Tangelder,
Hans G. Kerkhoff:
Integration of the Scan-Test Method into an Architecture Specific Core-Test Approach.
J. Electronic Testing 14(1-2): 125-131 (1999) |
| 1998 |
|---|
| 1 | EE | Erik Jan Marinissen,
Robert G. J. Arendsen,
Gerard Bos,
Hans Dingemanse,
Maurice Lousberg,
Clemens Wouters:
A structured and scalable mechanism for test access to embedded reusable cores.
ITC 1998: 284-293 |
