| |
| 2003 | ||
|---|---|---|
| 2 | EE | M. Stancic, Hans G. Kerkhoff: Testability-analysis driven test-generation of analogue cores. Microelectronics Journal 34(10): 913-917 (2003) |
| 2002 | ||
| 1 | EE | M. Stancic, L. Fang, M. H. H. Weusthof, R. M. W. Tijink, Hans G. Kerkhoff: A New Test Generation Approach for Embedded Analogue Cores in SoC. ITC 2002: 861-869 |
| 1 | L. Fang | [1] |
| 2 | Hans G. Kerkhoff | [1] [2] |
| 3 | R. M. W. Tijink | [1] |
| 4 | M. H. H. Weusthof | [1] |