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M. Stancic

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2003
2EEM. Stancic, Hans G. Kerkhoff: Testability-analysis driven test-generation of analogue cores. Microelectronics Journal 34(10): 913-917 (2003)
2002
1EEM. Stancic, L. Fang, M. H. H. Weusthof, R. M. W. Tijink, Hans G. Kerkhoff: A New Test Generation Approach for Embedded Analogue Cores in SoC. ITC 2002: 861-869

Coauthor Index

1L. Fang [1]
2Hans G. Kerkhoff [1] [2]
3R. M. W. Tijink [1]
4M. H. H. Weusthof [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)