| |
| 2004 | ||
|---|---|---|
| 3 | EE | Octavian Petre, Hans G. Kerkhoff: Scan Test Strategy for Asynchronous-Synchronous Interfaces. J. Electronic Testing 20(6): 639-645 (2004) |
| 2002 | ||
| 2 | EE | Octavian Petre, Hans G. Kerkhoff: On-Chip Tap-Delay Measurements for a Digital Delay-Line Used in High-Speed Inter-Chip Data Communications. Asian Test Symposium 2002: 122- |
| 2001 | ||
| 1 | EE | Octavian Petre, Hans G. Kerkhoff: Increasing the Fault Coverage in Multiple Clock Domain Systems by Using On-Line Testing of Synchronizers. IOLTW 2001: 95-99 |
| 1 | Hans G. Kerkhoff | [1] [2] [3] |