| |
| 1999 | ||
|---|---|---|
| 1 | EE | Chris Feige, Jan Ten Pierick, Clemens Wouters, Ronald J. W. T. Tangelder, Hans G. Kerkhoff: Integration of the Scan-Test Method into an Architecture Specific Core-Test Approach. J. Electronic Testing 14(1-2): 125-131 (1999) |
| 1 | Chris Feige | [1] |
| 2 | Hans G. Kerkhoff | [1] |
| 3 | Ronald J. W. T. Tangelder | [1] |
| 4 | Clemens Wouters | [1] |