| |
| 2000 | ||
|---|---|---|
| 2 | EE | Richard Rosing: A Fault Simulation Methodology for MEMS. DATE 2000: 476-457 |
| 1999 | ||
| 1 | EE | Richard Rosing, Hans G. Kerkhoff, Ronald J. W. T. Tangelder, Manoj Sachdev: Off-Chip Diagnosis of Aperture Jitter in Full-Flash Analog-to-Digital Converters. J. Electronic Testing 14(1-2): 67-74 (1999) |
| 1 | Hans G. Kerkhoff | [1] |
| 2 | Manoj Sachdev | [1] |
| 3 | Ronald J. W. T. Tangelder | [1] |