V. Kaal
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1997
1
EE
V. Kaal,
Hans G. Kerkhoff
: Compact structural test generation for analog macros.
ED&TC 1997
: 581-587
Coauthor
Index
1
Hans G. Kerkhoff
[
1
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Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
