| 2001 |
|---|
| 7 | | Frank F. Hsu,
Kenneth M. Butler,
Janak H. Patel:
A case study on the implementation of the Illinois Scan Architecture.
ITC 2001: 538-547 |
| 1998 |
|---|
| 6 | EE | Frank F. Hsu,
Janak H. Patel:
High-level variable selection for partial-scan implementation.
ICCAD 1998: 79-84 |
| 5 | EE | Frank F. Hsu,
Janak H. Patel:
High-Level Controllability and Observability Analysis for Test Synthesis.
J. Electronic Testing 13(2): 93-103 (1998) |
| 1997 |
|---|
| 4 | EE | Frank F. Hsu,
Janak H. Patel:
Design for Testability Using State Distances.
J. Electronic Testing 11(1): 93-100 (1997) |
| 1996 |
|---|
| 3 | EE | Frank F. Hsu,
Elizabeth M. Rudnick,
Janak H. Patel:
Enhancing high-level control-flow for improved testability.
ICCAD 1996: 322-328 |
| 2 | EE | Frank F. Hsu,
Elizabeth M. Rudnick,
Janak H. Patel:
Testability Insertion in Behavioral Descriptions.
ISSS 1996: 139-144 |
| 1995 |
|---|
| 1 | EE | Frank F. Hsu,
Janak H. Patel:
A distance reduction approach to design for testability.
VTS 1995: 158-163 |
