| |
| 2002 | ||
|---|---|---|
| 1 | EE | Jayashree Saxena, Kenneth M. Butler, John Gatt, R. Raghuraman, Sudheendra Phani Kumar, Supatra Basu, David J. Campbell, John Berech: Scan-Based Transition Fault Testing - Implementation and Low Cost Test Challenges . ITC 2002: 1120-1129 |
| 1 | Supatra Basu | [1] |
| 2 | Kenneth M. Butler | [1] |
| 3 | David J. Campbell | [1] |
| 4 | John Gatt | [1] |
| 5 | Sudheendra Phani Kumar | [1] |
| 6 | R. Raghuraman | [1] |
| 7 | Jayashree Saxena | [1] |